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Digital circuit testing and testability / Parag K. Lala.
Material type:
TextPublication details: San Diego : Academic Press, c1997.Description: xii, 199 p. : ill. ; 24 cmISBN: - 0124343309
| Item type | Current library | Home library | Collection | Shelving location | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|---|---|
Open Collection
|
FIRST CITY UNIVERSITY COLLEGE | FIRST CITY UNIVERSITY COLLEGE | Open Collection | FCUC Library | 621.395 LAL (Browse shelf(Opens below)) | Available | 00004066 |
Total holds: 0
Includes bibliographical references and index.