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Digital circuit testing and testability / (Record no. 1178)

MARC details
000 -LEADER
fixed length control field	00874nam a2200241 a 4500
001 - CONTROL NUMBER
control field	vtls000001583
003 - CONTROL NUMBER IDENTIFIER
control field	MY-PjKIC
005 - DATE AND TIME OF LATEST TRANSACTION
control field	20200206110951.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field	100211t1997 000 0 eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number	0124343309
035 ## - SYSTEM CONTROL NUMBER
System control number	0124343309
039 #9 - LEVEL OF BIBLIOGRAPHIC CONTROL AND CODING DETAIL [OBSOLETE]
Level of rules in bibliographic description	201006201201
Level of effort used to assign nonsubject heading access points	faridah7
Level of effort used to assign subject headings	201002111734
Level of effort used to assign classification	VLOAD
Level of effort used to assign subject headings	201002111610
Level of effort used to assign classification	VLOAD
--	201002111404
--	VLOAD
090 ## - LOCALLY ASSIGNED LC-TYPE CALL NUMBER (OCLC); LOCAL CALL NUMBER (RLIN)
Classification number (OCLC) (R) ; Classification number, CALL (RLIN) (NR)	621.395 LAL
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name	Lala, Parag K.,
Dates associated with a name	1948-
245 10 - TITLE STATEMENT
Title	Digital circuit testing and testability /
Statement of responsibility, etc.	Parag K. Lala.
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Place of publication, distribution, etc.	San Diego :
Name of publisher, distributor, etc.	Academic Press,
Date of publication, distribution, etc.	c1997.
300 ## - PHYSICAL DESCRIPTION
Extent	xii, 199 p. :
Other physical details	ill. ;
Dimensions	24 cm.
504 ## - BIBLIOGRAPHY, ETC. NOTE
Bibliography, etc. note	Includes bibliographical references and index.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element	Integrated circuits
General subdivision	Very large scale integration
--	Testing.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element	Digital integrated circuits
General subdivision	Testing.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element	Integrated circuits
General subdivision	Fault tolerance.

Holdings
Withdrawn status	Lost status	Damaged status	Not for loan	Collection code	Home library	Current library	Shelving location	Total Checkouts	Full call number	Barcode	Date last seen	Koha item type
				Open Collection	FIRST CITY UNIVERSITY COLLEGE	FIRST CITY UNIVERSITY COLLEGE	FCUC Library		621.395 LAL	00004066	03/02/2021	Open Collection