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Magnetic flux leakage : theories and imaging technologies / Songling Huang, Wei Zhao.

By: Contributor(s): Material type: TextTextSeries: Advances in electrical and electronic engineering ; volume 1Publisher: Berlin ; Boston : De Gruyter, [2016]Description: 1 online resourceContent type:
  • text
Media type:
  • computer
Carrier type:
  • online resource
ISBN:
  • 9783110480153
  • 3110480158
  • 9783110479713
  • 3110479710
Subject(s): Genre/Form: Additional physical formats: Print version:: Magnetic flux leakageDDC classification:
  • 620.1/1278 23
LOC classification:
  • TA417.3
Online resources:
Contents:
Frontmatter -- Preface -- Contents -- 1. Introduction -- 2. Testing Signal Processing Method -- 3. Quantitative Method of Magnetic Flux Leakage Testing -- 4. Defect Profile Inversion of Three-Dimensional MFL Detection -- 5. Three-Dimensional MFL Imaging Detection -- References -- Index
Summary: This book systematically introduces magnetic flux leakage testing principles and their applications in practice. Signal detection, collection, processing, the inversion of magnetic flux leakage defect and 3D imaging are discussed in detail with extensive project experiences, making the book an essential reference for researchers, developers and engineers in nondestructive testing.
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Includes bibliographical references and index.

Description based on print version record and CIP data provided by publisher; resource not viewed.

Frontmatter -- Preface -- Contents -- 1. Introduction -- 2. Testing Signal Processing Method -- 3. Quantitative Method of Magnetic Flux Leakage Testing -- 4. Defect Profile Inversion of Three-Dimensional MFL Detection -- 5. Three-Dimensional MFL Imaging Detection -- References -- Index

This book systematically introduces magnetic flux leakage testing principles and their applications in practice. Signal detection, collection, processing, the inversion of magnetic flux leakage defect and 3D imaging are discussed in detail with extensive project experiences, making the book an essential reference for researchers, developers and engineers in nondestructive testing.

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