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Secondary ion mass spectrometry : applications for depth profiling and surface characterization / Fred A. Stevie. by
  • Stevie, F. A [author.]
Series: Materials characterization and analysis collection
Material type: Text Text; Format: available online remote; Literary form: Not fiction ; Audience: Specialized;
Publisher: New York [New York] (222 East 46th Street, New York, NY 10017) : Momentum Press, 2016
Availability: No items available.

A practical guide to transmission electron microscopy : fundamentals / Zhiping Luo. by
  • Luo, Zhiping [author.]
Series: Materials characterization and analysis collection
Edition: First edition.
Material type: Text Text; Format: available online remote; Literary form: Not fiction ; Audience: Specialized;
Publisher: New York [New York] (222 East 46th Street, New York, NY 10017) : Momentum Press, 2016
Availability: No items available.

A practical guide to transmission electron microscopy. Volume II : Advanced microscopy / Zhiping Luo. by
  • Luo, Zhiping [author.]
Series: Materials characterization and analysis collection
Edition: First edition.
Material type: Text Text; Format: available online remote; Literary form: Not fiction ; Audience: Specialized;
Publisher: New York [New York] (222 East 46th Street, New York, NY 10017) : Momentum Press, 2016
Other title:
  • Advanced microscopy
Availability: No items available.

Spectroscopic ellipsometry : practical application to thin film characterization / Harland G. Tompkins and James N. Hilfiker. by
  • Tompkins, Harland G [author.]
  • Hilfiker, James N [author.]
Series: Materials characterization and analysis collection
Material type: Text Text; Format: available online remote; Literary form: Not fiction ; Audience: Specialized;
Publisher: New York [New York] (222 East 46th Street, New York, NY 10017) : Momentum Press, 2016
Availability: No items available.

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