Arithmetic built-in-self-test for embedded systems / Janusz Rajski, Jerzy Tyszer.

By:

Rajski, Janusz

Contributor(s):

Tyszer, Jerzy

Material type: Text

TextPublication details: Upper Saddle River, NJ : Prentice-Hall PTR, c1998.Description: xii, 268 p. : illISBN:

0137564384

Subject(s):

Summary: Arithmetic Built-In Self-Test for Embedded Systems offers a thorough treatment of the important issues in software-based built-in self-test for systems with embedded processors. Fundamental concepts are illustrated with practical scenarios for test generation, test application, and test response compaction. Arithmetic Built-In Self-Test for Embedded Systems uses an approach to cutting-edge technology that will be of interest to hardware and embedded system designers, test and design engineers, and researchers working on IC/core testing. It is also appropriate for graduate-level design courses. An introductory chapter provides a comprehensive tutorial covering the most relevant DFT and BIST techniques.

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Holdings ( 1 )
Title notes ( 2 )

Holdings
Item type	Current library	Home library	Collection	Shelving location	Call number	Status	Date due	Barcode	Item holds
Open Collection	FIRST CITY UNIVERSITY COLLEGE	FIRST CITY UNIVERSITY COLLEGE	Open Collection	FCUC Library	621.395 RAJ (Browse shelf(Opens below))	Available		00005298

Total holds: 0

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Includes bibliographical references and index.

Arithmetic Built-In Self-Test for Embedded Systems offers a thorough treatment of the important issues in software-based built-in self-test for systems with embedded processors. Fundamental concepts are illustrated with practical scenarios for test generation, test application, and test response compaction. Arithmetic Built-In Self-Test for Embedded Systems uses an approach to cutting-edge technology that will be of interest to hardware and embedded system designers, test and design engineers, and researchers working on IC/core testing. It is also appropriate for graduate-level design courses. An introductory chapter provides a comprehensive tutorial covering the most relevant DFT and BIST techniques.