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082 0 4 _a620.11072
_221
049 _aMAIN
245 0 0 _aResearch agenda for test methods and models to simulate the accelerated aging of infrastructure materials.
_nVol. 1.
260 _aWashington, D.C. :
_bNational Academy Press,
_c1999.
300 _a1 online resource (approximately 44 pages)
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
505 0 _aWorkshop synopsis and Committee findings and recommendations -- Background presentations -- Five overview briefings -- Infrastructure aging and deterioration / John M. Hanson -- Infrastructure considerations: surgical implant devices / Jack E. Lemons, John Anderson -- As high performance integrated circuits enter the national (and international) infrastructure, how do we know they are reliable? / Richard Wachnik -- Double glass for thousands of years? That is the question / Carol M. Jantzen -- Life-cycle performance in the electric utility industry / John Stringer -- Two focus briefings -- Life-prediction approaches for infrastructure applications / Kenneth Reifsnider -- Accelerated-testing approaches for infrastructure applications / Jonathan W. Martin.
588 0 _aPrint version record.
590 _aeBooks on EBSCOhost
_bEBSCO eBook Subscription Academic Collection - Worldwide
650 0 _aMaterials
_xDeterioration.
_0http://id.loc.gov/authorities/subjects/sh85082071
650 7 _aTECHNOLOGY & ENGINEERING
_xMaterial Science.
_2bisacsh
650 7 _aMaterials
_xDeterioration.
_2fast
_0(OCoLC)fst01011800
655 0 _aElectronic books.
655 4 _aElectronic books.
776 0 8 _iPrint version:
_tResearch agenda for test methods and models to simulate the accelerated aging of infrastructure materials. Vol. 1.
_dWashington, D.C. : National Academy Press, 1999
_z0309063841
_w(DLC) 00500285
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