000			01107cam a2200313 a 4500
001			vtls000000103
003			MY-PjKIC
005			20250102162643.0
008			100211s1993 nyua 001 0 eng d
020			_a9780023635267
035			_a0023635266
039		9	_a201206131735 _bnorliday _c201002111731 _dVLOAD _c201002111606 _dVLOAD _c201002111358 _dVLOAD
040			_cfcuc
050			_aTK454.K46 1993
082			_a621.3815/0285/5369 KEO 1993
090			_a621.3815 KEO 1993
100	1		_aKeown, John _q(John L.)
245	1	0	_aPspice and Circuit Analysis
250			_a2nd ed.
260			_aNew York : _bMerrill ; _aToronto : _bMaxwell Macmillan Canada ; _aNew York : _bMaxwell Macmillan International, _cc1993.
300			_axix, 562 p. : _bill. ; _c24 cm.
440		0	_aMerrill's international series in engineering technology.
500			_aIncludes index.
650		0	_aElectric circuit analysis _xData processing.
942			_2ddc _c3
999			_c331 _d331