000			00874nam a2200241 a 4500
001			vtls000001583
003			MY-PjKIC
005			20200206110951.0
008			100211t1997 000 0 eng d
020			_a0124343309
035			_a0124343309
039		9	_a201006201201 _bfaridah7 _c201002111734 _dVLOAD _c201002111610 _dVLOAD _y201002111404 _zVLOAD
090			_a621.395 LAL
100	1		_aLala, Parag K., _d1948-
245	1	0	_aDigital circuit testing and testability / _cParag K. Lala.
260			_aSan Diego : _bAcademic Press, _cc1997.
300			_axii, 199 p. : _bill. ; _c24 cm.
504			_aIncludes bibliographical references and index.
650		0	_aIntegrated circuits _xVery large scale integration _xTesting.
650		0	_aDigital integrated circuits _xTesting.
650		0	_aIntegrated circuits _xFault tolerance.
999			_c1178 _d1178