Backscattering from multiscale rough surfaces with application to wind scatterometry / Adrian K. Fung.
Material type: TextSeries: Artech House remote sensing libraryPublisher: Boston : Artech House, �2015Description: 1 online resource : illustrationsContent type:- text
- computer
- online resource
- 9781630810016
- 1630810010
- Backscattering
- Surfaces (Physics)
- Electromagnetic waves -- Scattering
- SCIENCE -- Physics -- Quantum Theory
- Backscattering
- Electromagnetic waves -- Scattering
- Surfaces (Physics)
- Radar/Remote Sensing
- Technology, Engineering, Agriculture
- Technologie, Ingenieurswissenschaft, Landwirtschaft
- Technologie, ing�enierie et agriculture
- Electronics & communications engineering
- Elektronik, Nachrichtentechnik
- Ing�enierie �electronique et technologie des communications
- Electronics engineering
- Elektronik
- G�enie �electronique
- Electronic devices & materials
- Elektronische Ger�ate und Materialien
- Dispositifs �electroniques et mat�eriels
- 539.758 23
- TJ163.9 .F86 2015
Print version record.
Includes bibliographical references and index.
Introduction -- Surface backscattering mechanisms -- Surface backscattering trends and comparisons with measurements -- Backscattering from the sea surface -- A geophysical model function for wing scatterometry.
This resource explains and demonstrates the backscattering properties of multiscale rough surfaces, and illustrates their application to establish the geophysical model function (GMF) needed in wind scatterometry. This book also explains how the mechanisms of backscattering change with frequency and the incident angle on a multiscale surface and how to recognize single scale versus multiscale surfaces - very useful information for those wanting to use backscattering models more efficiently. Publisher abstract.
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