Buckroyd, Allen. <br/><br/>
In-circuit testing / 
/ Allen Buckroyd. 
 - Jordan Hill, Oxford, England  ; Boston :  : Butterworth-Heinemann,  1994. 
 - xiv, 168 p. :  : ill. ;  ; 24 cm. 
<br/><br/>Includes bibliographical references and index. 
<br/><br/><label>ISBN: </label>0750609303 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Printed circuits--Testing.